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High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity. Size: 21 mm Line width: 17 µm
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Platinum apertures are easily cleaned by either an aperture flamer or over a bunsen burner in the open air. We maintain a wide variety of Platinum Drilled Apertures in stock with different configurations suiting all of your needs. Nominal hole diameter: +/- 1 micron. Disc diameter: +/- 10 microns. Disc thickness: +/- 10 microns Size: 50 µm O.D.: 3 mm Thickness: 0.12 mm
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Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter. Grid: Gold Pitch: 83 µm Hole: 45 µm Bar: 38 µm
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Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter. Grid: Nickel Pitch: 83 µm Hole: 45 µm Bar: 38 µm
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These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale. Size: 19 mm
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Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness. Grid: Nickel Pitch: 254 µm Hole: 213 µm Bar: 41 µm :
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Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness. Grid: Nickel Pitch: 63 µm Hole: 43 µm Bar: 20 µm :
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Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter. Grid: Copper Pitch: 250 µm Hole: 200 µm Bar: 50 µm
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Large slotted head pin stub mount are for Leica, Cambridge, LEO, FEI, Phillips, Zeiss, and Camscan SEMs specimen mounts. Made from lathe finished ultra-pure aluminum. Head: 1-1/4" Pin height: 1/2" Pin diameter: 1/8"
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Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish. Head: 1" Height: 1/2"
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Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from spectroscopically pure carbon. Head: 3/8" Height: 3/8"
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SEM specimen mount with shorter pin and slotted head for use with Zeiss/LEO 1500 SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish. Head: 1-1/4" Pin height: 6 mm Pin diameter: 1/8"
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Cylinder specimen mounts are for use with JEOL, ISI, ABT, and Topcon scanning electron microscopes. Made from ultra-pure aluminum with a standard lathe finish. Head: 9.5 mm Height: 9.5 mm
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